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[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Investigation of ballistic current in scaled Floating-gate NAND FLASH and a solution
Raghunathan, Shyam, Krishnamohan, Tejas, Parat, Krishna, Saraswat, KrishnaYear:
2009
Language:
english
DOI:
10.1109/iedm.2009.5424216
File:
PDF, 1.16 MB
english, 2009