![](/img/cover-not-exists.png)
[IEEE 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Hangzhou, China (2011.05.10-2011.05.12)] 2011 IEEE International Instrumentation and Measurement Technology Conference - A 2-FFT method for on-chip spectral testing without requiring coherency
Sudani, Siva, Chen, Degang, Geiger, RandyYear:
2011
Language:
english
DOI:
10.1109/imtc.2011.5944341
File:
PDF, 1.88 MB
english, 2011