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[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - A hierarchical test scheme for system-on-chip designs
Jin-Fu Li,, Hsin-Jung Huang,, Jeng-Bin Chen,, Chih-Ping Su,, Cheng-Wen Wu,, Chuang Cheng,, Shao-I Chen,, Chi-Yi Hwang,, Hsiao-Ping Lin,Year:
2002
Language:
english
DOI:
10.1109/date.2002.998317
File:
PDF, 261 KB
english, 2002