[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up
Acar, Erkan, Ozev, Sule, Redmond, Kevin B.Year:
2007
Language:
english
DOI:
10.1109/vts.2007.6
File:
PDF, 411 KB
english, 2007