[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA...

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[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up

Acar, Erkan, Ozev, Sule, Redmond, Kevin B.
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Year:
2007
Language:
english
DOI:
10.1109/vts.2007.6
File:
PDF, 411 KB
english, 2007
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