[IEEE 2005 International Symposium on Electromagnetic...

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[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - A multimodal analysis of the effects of guard traces over near wideband signal paths

Pajares, F.-J., Ribo, M., Regue, J.-R., Rodriguez-Cepeda, P., Pradell, L.
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Volume:
3
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513659
File:
PDF, 304 KB
english, 2005
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