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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - QED: Quick Error Detection tests for effective post-silicon validation
Hong, Ted, Li, Yanjing, Park, Sung-Boem, Mui, Diana, Lin, David, Kaleq, Ziyad Abdel, Hakim, Nagib, Naeimi, Helia, Gardner, Donald S., Mitra, SubhasishYear:
2010
Language:
english
DOI:
10.1109/test.2010.5699215
File:
PDF, 1.90 MB
english, 2010