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[IEEE 57th ARFTG Conference Digest - Phoenix, AZ, USA (2001.05.25-2001.05.25)] 57th ARFTG Conference Digest - A New Loopback GSM/DCS Bit Error Rate Test Method On Baseband I/Q Outputs
Nowakowski, Jean-Francois, Bonhoure, Bruno, Carbonero, Jean-LouisYear:
2001
Language:
english
DOI:
10.1109/arftg.2001.327472
File:
PDF, 923 KB
english, 2001