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[IEEE 2008 IEEE International Frequency Control Symposium - Honolulu, HI (2008.05.19-2008.05.21)] 2008 IEEE International Frequency Control Symposium - An improved mode shape measurement system with two lasers of different wavelengths

Watanabe, Yasuaki, Imaeda, Noriyuki, Tachibana, Kentaro, Goka, Shigeyoshi, Sato, Takayuki, Sekimoto, Hitoshi
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Year:
2008
Language:
english
DOI:
10.1109/freq.2008.4622994
File:
PDF, 500 KB
english, 2008
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