[IEEE 2008 IEEE International Frequency Control Symposium - Honolulu, HI (2008.05.19-2008.05.21)] 2008 IEEE International Frequency Control Symposium - An improved mode shape measurement system with two lasers of different wavelengths
Watanabe, Yasuaki, Imaeda, Noriyuki, Tachibana, Kentaro, Goka, Shigeyoshi, Sato, Takayuki, Sekimoto, HitoshiYear:
2008
Language:
english
DOI:
10.1109/freq.2008.4622994
File:
PDF, 500 KB
english, 2008