A system for one- and two-dimensional signal processing for X-ray scattering, tunneling-and atomic force microscopy applications
Halling, H., Moeller, R., Schummers, A.Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.34515
Date:
January, 1989
File:
PDF, 338 KB
english, 1989