[IEEE 2012 IEEE Applied Power Electronics Conference and Exposition - APEC 2012 - Orlando, FL, USA (2012.02.5-2012.02.9)] 2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - Finite element analysis of inductor core loss under DC bias condition
Mu, Mingkai, Zheng, Feng, Li, Qiang, Lee, Fred C.Year:
2012
Language:
english
DOI:
10.1109/apec.2012.6165851
File:
PDF, 863 KB
english, 2012