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[IEEE 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - New York, NY, USA (17-22 June 2006)] 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - Human Face Modeling and Recognition Through Multi-View High Resolution Stereopsis
Xin Chen,, Faltemier, T., Flynn, P., Bowyer, K.Year:
2006
Language:
english
DOI:
10.1109/cvprw.2006.95
File:
PDF, 770 KB
english, 2006