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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - A 3-D stacked package solution for DDR-SDRAM applications
Krishnan, S., Young-Gon Kim,, Bang, K.Year:
2004
Language:
english
DOI:
10.1109/stherm.2004.1291303
File:
PDF, 1005 KB
english, 2004