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[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Scaling down of tunnel oxynitride in NAND flash memory: oxynitride selection and reliabilities
Jonghan Kim,, Jung Dal Choi,, Wang Chul Shin,, Dong Jun Kim,, Hong Soo Kim,, Kyong Moo Mang,, Sung Tae Ahn,, Oh Hyun Kwon,Year:
1997
Language:
english
DOI:
10.1109/relphy.1997.584220
File:
PDF, 501 KB
english, 1997