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Soft X-ray resonant scattering: An element-specific tool to characterize patterned arrays of nanomagnets
Sanchez-Hanke, C., Castano, F.J., Hao, Y., Hulbert, S.L., Ross, C.A., Smith, H.I., Chi-Chang Kao,Volume:
39
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2003.816179
Date:
September, 2003
File:
PDF, 611 KB
english, 2003