[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Network Fault Model for Dependability Assessment of Networked Embedded Systems
Fummi, Franco, Quaglia, Davide, Stefanni, FrancescoYear:
2008
Language:
english
DOI:
10.1109/dft.2008.21
File:
PDF, 395 KB
english, 2008