Simulating total-dose and dose-rate effects on digital...

IEEE Transactions on Nuclear Science 1995 / Dec. Vol. 42; Iss. 6

Simulating total-dose and dose-rate effects on digital microelectronics timing delays using VHDL

Brothers, C.P., Pugh, R.D.
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.488759
Date:
January, 1995
File:
PDF, 826 KB
english, 1995
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