[IEEE IEEE 43rd Electronic Components and Technology Conference (ECTC '93) - Orlando, FL, USA (1-4 June 1993)] Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93) - Analysis of the stresses in the chip's coating
Voloshin, A.S., Pei-Haw Tsao,Year:
1993
Language:
english
DOI:
10.1109/ectc.1993.346778
File:
PDF, 338 KB
english, 1993