[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Electrical characterization of novel PMNT thin-films
Chen, Wenbin, McCarthy, Kevin G., Copuroglu, Mehmet, O'Brien, Shane, Winfield, Richard, Mathewson, AlanYear:
2010
Language:
english
DOI:
10.1109/icmts.2010.5466848
File:
PDF, 139 KB
english, 2010