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[IEEE 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Hamburg, Germany (2008.09.8-2008.09.12)] 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - IC models accounting for effects of EM noise
Stievano, Igor S., Canavero, Flavio G., Vialardi, EnricoYear:
2008
Language:
english
DOI:
10.1109/emceurope.2008.4786848
File:
PDF, 1.15 MB
english, 2008