![](/img/cover-not-exists.png)
[IEEE ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings - Bangi, Malaysia (24-26 Nov. 1998)] ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) - Degradation modeling of semiconductor devices and electrical circuits
Lagies, A.U., Gohler, L., Sigg, J., Turkes, P., Kraus, R.Year:
1998
Language:
english
DOI:
10.1109/smelec.1998.781155
File:
PDF, 320 KB
english, 1998