Go/No-Go Testing of VCO Modulation RF Transceivers Through...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2007 / 01 Vol. 15; Iss. 1

Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup

Acar, Erkan, Ozev, Sule
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Volume:
15
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2007.891082
Date:
January, 2007
File:
PDF, 983 KB
english, 2007
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