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[IEEE 2006 International Conference on Microelectronics - Dhahran, Saudi Arabia (2006.12.16-2006.12.19)] 2006 International Conference on Microelectronics - Experimental Evaluation of Three Concurrent Error Detection Mechanisms
Vahdatpour, Alireza, Fazeli, Mahdi, Miremadi, Seyed GhassemYear:
2006
Language:
english
DOI:
10.1109/icm.2006.373268
File:
PDF, 2.57 MB
english, 2006