High-spatial resolution resistivity mapping of large-area YBCO films by a near-field millimeter-wave microscope
Golosovsky, M., Galkin, A., Davidov, D.Volume:
44
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/22.508246
Date:
July, 1996
File:
PDF, 579 KB
english, 1996