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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Aging sensors for workload centric guardbanding in dynamic voltage scaling applications
Min Chen,, Kufluoglu, H., Carulli, J., Reddy, V.Year:
2013
Language:
english
DOI:
10.1109/irps.2013.6532004
File:
PDF, 516 KB
english, 2013