[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - 65nm CMOS BULK to SOI comparison
Pelloie, J.L., Laplanche, Y., Chen, T. F., Huang, Y. T., Liu, P. W., Chiang, W. T., Huang, M. Y. T., Tsai, C. H., Cheng, Y. C., Tsai, C. T., Ma, G. H.Year:
2007
Language:
english
DOI:
10.1109/soi.2007.4357861
File:
PDF, 1.16 MB
english, 2007