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[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - Application of byte error detecting codes to the design of self-checking circuits
Pagey, S., Al-Khalili, A.J.Year:
1994
Language:
english
DOI:
10.1109/ats.1994.367256
File:
PDF, 585 KB
english, 1994