[IEEE 2010 2nd International Conference on Mechanical and...

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[IEEE 2010 2nd International Conference on Mechanical and Electrical Technology (ICMET) - Singapore, Singapore (2010.09.10-2010.09.12)] 2010 International Conference on Mechanical and Electrical Technology - Medical image analysis of electron micrographs in diabetic patients using contrast enhancement

Shaik, Fahimuddin., Giri Prasad, M.N., Rao, Jayabhaskar, Abdul Rahim, B., SomaSekhar, A.
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Year:
2010
Language:
english
DOI:
10.1109/icmet.2010.5598408
File:
PDF, 1.48 MB
english, 2010
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