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[IEEE Comput. Soc IEEE 27th International Symposium on Fault Tolerant Computing - Seattle, WA, USA (24-27 June 1997)] Proceedings of IEEE 27th International Symposium on Fault Tolerant Computing - VERIFY: evaluation of reliability using VHDL-models with embedded fault descriptions
Sieh, V., Tschache, O., Balbach, F.Year:
1997
Language:
english
DOI:
10.1109/ftcs.1997.614074
File:
PDF, 479 KB
english, 1997