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[IEEE 2011 5th International Symposium on Empirical Software Engineering and Measurement (ESEM) - Banff, AB, Canada (2011.09.22-2011.09.23)] 2011 International Symposium on Empirical Software Engineering and Measurement - Mining Static Code Metrics for a Robust Prediction of Software Defect-Proneness
Li, Lianfa, Leung, HaretonYear:
2011
Language:
english
DOI:
10.1109/esem.2011.29
File:
PDF, 228 KB
english, 2011