In situ TEM analysis of resistive switching in manganite based thin-film heterostructures
Norpoth, Jonas, Mildner, Stephanie, Scherff, Malte, Hoffmann, Jörg, Jooss, ChristianVolume:
6
Language:
english
Journal:
Nanoscale
DOI:
10.1039/c4nr02020k
Date:
June, 2014
File:
PDF, 1.19 MB
english, 2014