[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Statistical prediction of circuit aging under process variations
Wang, Wenping, Reddy, Vijay, Bo Yang,, Balakrishnan, Varsha, Krishnan, Srikanth, Yu Cao,Year:
2008
Language:
english
DOI:
10.1109/cicc.2008.4672007
File:
PDF, 326 KB
english, 2008