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[IEEE 2010 12th International Power Electronics Congress (CIEP) - San Luis Potosi, Mexico (2010.08.22-2010.08.25)] 12th IEEE International Power Electronics Congress - Diagnosis test of power cables using a resonant test system and analysis of partial discharge on site
Jaramillo-Vacio, Ruben, Ochoa -Zezzatti, C. A., Jons, S., Ledesma-Orozco, SergioYear:
2010
Language:
english
DOI:
10.1109/ciep.2010.5598840
File:
PDF, 254 KB
english, 2010