[IEEE IEDM Technical Digest. IEEE International Electron...

  • Main
  • [IEEE IEDM Technical Digest. IEEE...

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - High performance and high reliability polysilicon thin-filmiyansistors with multiple nano-wire channels

Yung-Chun Wu,, Chun-Yen Chang,, Ting-Chang Chang,, Po-Tsun Liu,, Chi-Shen Chen,, Chun-Hao Tu,, Hsiao-Wen Zan,, Ya-Hsiang Tai,, Simon Min Sze,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2004
Language:
english
DOI:
10.1109/iedm.2004.1419289
File:
PDF, 237 KB
english, 2004
Conversion to is in progress
Conversion to is failed