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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - High performance and high reliability polysilicon thin-filmiyansistors with multiple nano-wire channels
Yung-Chun Wu,, Chun-Yen Chang,, Ting-Chang Chang,, Po-Tsun Liu,, Chi-Shen Chen,, Chun-Hao Tu,, Hsiao-Wen Zan,, Ya-Hsiang Tai,, Simon Min Sze,Year:
2004
Language:
english
DOI:
10.1109/iedm.2004.1419289
File:
PDF, 237 KB
english, 2004