[IEEE 2007 IEEE International Test Conference - Santa...

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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Data jitter measurement using a delta-time-to-voltage converter method

Kiyotaka Ichiyama,, Masahiro Ishida,, Yamaguchi, Takahiro J., Mani Soma,
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Year:
2007
Language:
english
DOI:
10.1109/test.2007.4437569
File:
PDF, 389 KB
english, 2007
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