[IEEE 2012 6th International Conference on Software Security and Reliability (SERE) - Gaithersburg, MD, USA (2012.06.20-2012.06.22)] 2012 IEEE Sixth International Conference on Software Security and Reliability - µTIL: Mutation-based Statistical Test Inputs Generation for Automatic Fault Localization
Delahaye, Mickael, Briand, Lionel C., Gotlieb, Arnaud, Petit, MatthieuYear:
2012
Language:
english
DOI:
10.1109/sere.2012.32
File:
PDF, 519 KB
english, 2012