[IEEE 2012 6th International Conference on Software...

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[IEEE 2012 6th International Conference on Software Security and Reliability (SERE) - Gaithersburg, MD, USA (2012.06.20-2012.06.22)] 2012 IEEE Sixth International Conference on Software Security and Reliability - µTIL: Mutation-based Statistical Test Inputs Generation for Automatic Fault Localization

Delahaye, Mickael, Briand, Lionel C., Gotlieb, Arnaud, Petit, Matthieu
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Year:
2012
Language:
english
DOI:
10.1109/sere.2012.32
File:
PDF, 519 KB
english, 2012
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