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[IEEE 1999 Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, MN, USA (26-28 Sept. 1999)] Proceedings of the 1999 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.99CH37024) - Impact-ionization induced instabilities in high-speed bipolar transistors and their influence on the maximum usable output voltage
Rickelt, M., Rein, H.-M.Year:
1999
Language:
english
DOI:
10.1109/bipol.1999.803524
File:
PDF, 417 KB
english, 1999