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[IEEE 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Warsaw, Poland (2014.4.23-2014.4.25)] 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Quality assurance in memory built-in self-test tools
Au, Albert, Pogiel, Artur, Rajski, Janusz, Sydow, Piotr, Tyszer, Jerzy, Zawada, JustynaYear:
2014
Language:
english
DOI:
10.1109/ddecs.2014.6868760
File:
PDF, 416 KB
english, 2014