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[IEEE 2010 IEEE International Carnahan Conference on Security Technology (ICCST) - San Jose, CA, USA (2010.10.5-2010.10.8)] 44th Annual 2010 IEEE International Carnahan Conference on Security Technology - Scatter enhanced 3D X-ray imaging for materials identification
Chan, Jer, Evans, Paul, Wang, Xun, Godber, Simon, Peatfield, Ian, Rogers, Keith, Rogers, Joseph, Dicken, AnthonyYear:
2010
Language:
english
DOI:
10.1109/ccst.2010.5678684
File:
PDF, 1.77 MB
english, 2010