![](/img/cover-not-exists.png)
[IEEE Comput. Soc. Press Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium - Atlantic City, NJ, USA (6-8 April 1993)] Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium - Evaluation of test generation algorithms
Yinghua Min,, Zhongcheng Li,Year:
1993
Language:
english
DOI:
10.1109/vtest.1993.313376
File:
PDF, 285 KB
english, 1993