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[IEEE 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems (BTAS) - Washington, DC, USA (2009.09.28-2009.09.30)] 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems - A meta-analysis of face recognition covariates

Lui, Yui Man, Bolme, David, Draper, Bruce A., Beveridge, J. Ross, Givens, Geoff, Phillips, P. Jonathon
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Year:
2009
Language:
english
DOI:
10.1109/btas.2009.5339025
File:
PDF, 126 KB
english, 2009
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