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[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Interleaving of Delay Fault Tes Data for Efficient Test Compression with Statistical Coding
Namba, Kazuteru, Ito, HideoYear:
2006
Language:
english
DOI:
10.1109/ats.2006.260960
File:
PDF, 3.75 MB
english, 2006