[IEEE 2009 IEEE Radiation Effects Data Workshop (in Conjunction with NSREC 2009) - Quebec, Canada (2009.07.20-2009.07.24)] 2009 IEEE Radiation Effects Data Workshop - Low Dose Rate Test Results of National Semiconductor's ELDRS-Free Bipolar Low Dropout (LDO) Regulator, LM2941 at Dose Rates of 1 and 10 Mrad(Si)/S

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