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[IEEE 2011 Joint Conf of 21st Int'l Workshop on Software Measurement and the 6th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA) - Nara, Japan (2011.11.3-2011.11.4)] 2011 Joint Conference of the 21st International Workshop on Software Measurement and the 6th International Conference on Software Process and Product Measurement - Good or Bad Committers? A Case Study of Committers' Cautiousness and the Consequences on the Bug Fixing Process in the Eclipse Project
Jongyindee, Anakorn, Ohira, Masao, Ihara, Akinori, Matsumoto, Ken-ichiYear:
2011
Language:
english
DOI:
10.1109/iwsm-mensura.2011.24
File:
PDF, 735 KB
english, 2011