[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Time Resolved Imaging at low power supply on 45nm technology
Bascoul, G., Perdu, P., Celi, G., Dudit, S., Lewis, D.Year:
2011
Language:
english
DOI:
10.1109/ipfa.2011.5992726
File:
PDF, 624 KB
english, 2011