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[IEEE 2011 IEEE International Conference on Development and Learning (ICDL) - Frankfurt am Main, Germany (2011.08.24-2011.08.27)] 2011 IEEE International Conference on Development and Learning (ICDL) - Robust central pattern generators for embodied hierarchical reinforcement learning
Snel, Matthijs, Whiteson, Shimon, Kuniyoshi, YasuoYear:
2011
Language:
english
DOI:
10.1109/devlrn.2011.6037352
File:
PDF, 1.00 MB
english, 2011