Application of conventional- and dual-energy X-ray...

Application of conventional- and dual-energy X-ray tomography in process engineering

Gehrke, S., Wirth, K.-E.
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Volume:
5
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2005.843890
Date:
April, 2005
File:
PDF, 1.08 MB
english, 2005
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