[IEEE 1998 High-Temperature Electronic Materials, Devices...

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[IEEE 1998 High-Temperature Electronic Materials, Devices and Sensors Conference - San Diego, CA, USA (22-27 Feb. 1998)] 1998 High-Temperature Electronic Materials, Devices and Sensors Conference (Cat. No.98EX132) - Reliability concerns in high temperature electronic systems

McCluskey, P., Grybowski, R.R., Condra, L., Das, D., Fink, J., Jordan, J., Torri, T.
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Year:
1998
Language:
english
DOI:
10.1109/htemds.1998.730698
File:
PDF, 771 KB
english, 1998
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