Scanning Probe Microscopy

IEEE Control Systems Magazine 2008 / 04 Vol. 28; Iss. 2

Scanning Probe Microscopy

SALAPAKA, SRINIVASA, SALAPAKA, MURTI
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Volume:
28
Language:
english
Journal:
IEEE Control Systems Magazine
DOI:
10.1109/mcs.2007.914688
Date:
April, 2008
File:
PDF, 2.65 MB
english, 2008
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