![](/img/cover-not-exists.png)
The particle tracking silicon microscope PTSM
Sadrozinski, H.F.-W., Bashkirov, V., Bruzzi, M., Ebrahimi, M., Feldt, J., Heimann, J., Keeney, B., Martinez-McKinney, F., Menichelli, D., Nelson, G., Nesom, G., Schulte, R.W.M., Seiden, A., Spencer, EVolume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.836138
Date:
October, 2004
File:
PDF, 690 KB
english, 2004