EXAFS analysis of vanadium oxide thin overlayers on silica...

EXAFS analysis of vanadium oxide thin overlayers on silica prepared by chemical vapour deposition

Inumaru, Kei, Okuhara, Toshio, Misono, Makoto, Matsubayashi, Nobuyuki, Shimada, Hiromichi, Nishijima, Akio
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Volume:
88
Year:
1992
Language:
english
Journal:
Journal of the Chemical Society, Faraday Transactions
DOI:
10.1039/ft9928800625
File:
PDF, 669 KB
english, 1992
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